Scientific program
PROGRAM
10:00 |
Meeting inauguration [Academic Authorities] Chairpersons: M. Krintus, M. Panteghini |
MORNING SESSION | |
10:30 | Metrological traceability as a unique tool to improve the quality of laboratory tests (R. Wielgosz) |
11:00 | Measurement uncertainty as a key performance indicator in medical laboratories (F. Borrillo) |
11:30 | Analytical performance specifications: moving from theoretical principles to practice (M. Panteghini) |
12:00 | Redesign Internal Quality Control to obtain information about metrological traceability of IVD-MDs and associated measurement uncertainty (E. Aloisio) |
12:30 | Discussion |
13:00 | Break |
AFTERNOON SESSION | |
14:00 | How to expand our horizons and use External Quality Assessment for checking the clinical suitability of laboratory measurements (S. Sandberg) |
14:30 | The central role of commutability of materials used for trueness calibration and surveillance purposes (V. Delatour) |
15:00 | Not all biases are created equal: how to deal with bias on laboratory measurements (M. Panteghini) |
15:30 | The importance and challenges of establishing reference measurement laboratories in IVD manufacturers (M. Witkowski) |
16:00 | Discussion |
SPEAKERS and CHAIRS
E. Aloisio
Clinical Pathology Unit, ASST Fatebenefratelli-Sacco,
Milan, Italy
F. Borrillo
Clinical Pathology Unit, ASST Fatebenefratelli-Sacco,
Milan, Italy
V. Delatour
Laboratoire National de Métrologie et d’Essais (LNE),
Paris, France
M. Krintus
Nicolaus Copernicus University in Torun,
Collegium Medicum in Bydgoszcz, Poland
M. Panteghini
Nicolaus Copernicus University in Torun,
Collegium Medicum in Bydgoszcz, Poland
S. Sandberg
Norwegian Organisation for Quality Improvement of Laboratory Examinations (NOKLUS),
Bergen, Norway
R. Wielgosz
Bureau International des Poids et Mesures
Sevres Cedex, France
M. Witkowski
Shenzhen New Industries Biomedical Engineering Co., Shenzhen, P.R. China